• DocumentCode
    1920419
  • Title

    Charge Pumping of Single Interface Traps in Submicron MOSFET´s

  • Author

    Groeseneken, G. ; De Wolf, L. ; Bellens, R. ; Maes, H.E.

  • Author_Institution
    IMEC, Kapeldreef 75, 3001 Leuven, Belgium.
  • fYear
    1994
  • fDate
    11-15 Sept. 1994
  • Firstpage
    609
  • Lastpage
    612
  • Abstract
    Charge pumping of single interface traps in small area MOSFET´s is demonstrated for the first time. The dependence of the single trap charge pumping current on the base level voltage is described. Also the creation of one single interface trap under influence of low level hot carrier injection is demonstrated. The correlation with RTS-noise experiments is discussed.
  • Keywords
    Charge pumps; Electron traps; Equations; Frequency measurement; Geometry; Hot carrier injection; MOSFET circuits; Photonic band gap; Pulse measurements; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
  • Conference_Location
    Edinburgh, Scotland
  • Print_ISBN
    0863321579
  • Type

    conf

  • Filename
    5435791
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1920419