Title :
Wear of the Mr head in the helical-scanning tape systems
Author :
Kamatani, Y. ; Nagai, N. ; Kondo, M. ; Onodera, S. ; Onoe, S. ; Ozue, T.
Author_Institution :
Sony Corporation
Keywords :
Electrical resistance measurement; Magnetic films; Magnetic heads; Magnetic recording; Magnetoresistance; Positron emission tomography; Protection; Radio frequency; Research and development; Testing;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837123