DocumentCode :
1920763
Title :
7.4: Dose control circuits for digitally addressable VACNF based maskless lithography
Author :
Eliza, Sazia A. ; Islam, Syed K. ; Rahman, Touhidur ; Bull, Nora D. ; Blalock, Benjamin J. ; Baylor, Larry R. ; Ericson, Milton N. ; Gardner, Walter L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
fYear :
2010
fDate :
26-30 July 2010
Firstpage :
109
Lastpage :
110
Abstract :
This paper presents dose control electronics and a digital addressing method for the vertically aligned carbon nanofiber (VACNF) based massively parallel maskless e-beam lithography system. The Digital Electrostatically focused e-beam Array direct-write Lithography (DEAL) developed by our research group in Oak Ridge National Laboratory incorporates digitally addressable field emission arrays (DAFEAs) of the VACNFs which function as the lithography heads during the exposure of the resist. A logic and memory control circuit (LMC) and a dose control circuit (DCC) have been designed to write a desired pattern and control the dose of electrons, respectively. This paper summarizes our previous works on different versions of the DCCs designed and optimized in the effort of obtaining a fixed and optimum dosage with the smaller circuit area.
Keywords :
carbon nanotubes; electron beam lithography; logic circuits; storage management chips; C; digital addressable VACNF method; digital addressable field emission arrays; digital electrostatic focused e-beam array direct-write lithography; digital electrostatically focused e-beam array; dose control circuits; dose control electronics; electron dose; logic circuit; massive parallel maskless e-beam lithography system; memory control circuit; vertical aligned carbon nanofiber; Arrays; Carbon dioxide; Delay; Laboratories; Lithography; Resists; USA Councils; Dose Control Circuit; Maskess Lithography; Vertically Aligned Carbon Nanofiber;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location :
Palo Alto, CA
Print_ISBN :
978-1-4244-7889-7
Electronic_ISBN :
978-1-4244-7888-0
Type :
conf
DOI :
10.1109/IVNC.2010.5563200
Filename :
5563200
Link To Document :
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