Title :
Exploration of novel gap material: electric and magnetic properties of NiFe/NiO/NiFe
Author :
Lai, Chih-Huang ; Jeng, Ruey-Wen ; Wu, Jenn-Ming
Author_Institution :
National Tsing Hua University
Keywords :
Annealing; Breakdown voltage; Conductivity; Leakage current; Magnetic films; Magnetic materials; Magnetic properties; Materials science and technology; Semiconductor films; Temperature measurement;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837149