Title :
Microwave Diode Intrinsic LF Noise Measurements
Author :
Buvin, G.M. ; Shvachkin, A.M.
Author_Institution :
OAO FAZOTRON NIIR Corp., Moscow
Abstract :
Standard procedures for noise measurements of microwave diodes are discussed. It has been established that the application of such measurement procedures provides different results in the LF range depending on the way of diode excitation: by DC from a DC source, or microwave oscillator. LF noise measurements of several microwave diodes are presented.
Keywords :
microwave diodes; microwave oscillators; noise measurement; DC source; LF noise measurement; microwave diode; microwave oscillator; Diodes; Low-frequency noise; Microwave measurements; Noise measurement;
Conference_Titel :
Microwave & Telecommunication Technology, 2007. CriMiCo 2007. 17th International Crimean Conference
Conference_Location :
Crimea
Print_ISBN :
978-966-335-012-7
DOI :
10.1109/CRMICO.2007.4368910
