• DocumentCode
    1920991
  • Title

    Constant and Switched Bias Low Frequency Noise in p-MOSFETs with Varying Gate Oxide Thickness

  • Author

    Kolhatkar, J.S. ; Salm, C. ; Knitel, M.J. ; Wallinga, H.

  • Author_Institution
    University of Twente, Enschede, The Netherlands
  • fYear
    2002
  • fDate
    24-26 September 2002
  • Firstpage
    83
  • Lastpage
    86
  • Keywords
    1f noise; CMOS technology; Current measurement; Fluctuations; Geometry; Low-frequency noise; MOSFET circuits; Noise measurement; Noise reduction; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194876
  • Filename
    1503806
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1920991