Title :
Surface specularity of NiFe, Co and Cu thin films by in-situ conductance measurement
Author :
Yamada, Kenichino ; Bailey, William E. ; Fery, Christophe ; Wang, Shan X.
Author_Institution :
Stanford University
Keywords :
Electrical resistance measurement; Giant magnetoresistance; Gold; Magnetic multilayers; Materials science and technology; Solid modeling; Spin valves; Substrates; Thermal resistance; Transistors;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837157
