Title :
The optimum oxidation state of AlO/sub x/ magnetic tunnel junctions
Author :
Gillies, M.F. ; Oepts, W. ; Kuiper, A.E.T. ; Coehoorn, R. ; Tamminga, Y. ; Snijders, J.H.M. ; Bik, W.M.Arnold
Author_Institution :
Eindhoven University of Technology
Keywords :
Artificial intelligence; Information analysis; Ion beams; Laboratories; Magnetic tunneling; Measurement errors; Oxidation; Spectroscopy; Thickness measurement; Voltage;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837161