• DocumentCode
    1921392
  • Title

    Accurate Delay Metric for On-chip Resistive Interconnect

  • Author

    Oulmane, Mourad ; Rumin, Nicholas C.

  • Author_Institution
    McGill University, Montreal, Canada
  • fYear
    2002
  • fDate
    24-26 September 2002
  • Firstpage
    143
  • Lastpage
    146
  • Keywords
    Circuit simulation; Delay effects; Design engineering; Design optimization; Digital integrated circuits; Equations; Integrated circuit interconnections; Integrated circuit technology; Propagation delay; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194890
  • Filename
    1503820
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1921392