Title :
Accurate Delay Metric for On-chip Resistive Interconnect
Author :
Oulmane, Mourad ; Rumin, Nicholas C.
Author_Institution :
McGill University, Montreal, Canada
fDate :
24-26 September 2002
Keywords :
Circuit simulation; Delay effects; Design engineering; Design optimization; Digital integrated circuits; Equations; Integrated circuit interconnections; Integrated circuit technology; Propagation delay; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194890
