DocumentCode :
1921427
Title :
A New Approach to Failure Analysis and Yield Enhancement of Very Large-scale Integrated Systems
Author :
Amakawa, Shuhei ; Nakazato, Kazuo ; Mizuta, Hiroshi
Author_Institution :
University of Cambridge, United Kingdom
fYear :
2002
fDate :
24-26 September 2002
Firstpage :
147
Lastpage :
150
Keywords :
Current measurement; Failure analysis; Laboratories; Leakage current; MOSFETs; Microelectronics; Probability distribution; Random access memory; Tunneling; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.194891
Filename :
1503821
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1921427
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