Title :
Surface morphology and critical current of high quality YBa/sub 2/Cu/sub 2/O/sub 7/ thin films on sapphire substrate
Author :
Kim, In-Seon ; Lim, Hae-Ryong ; Kim, Dong Ho ; Park, Yong Ki ; Park, Long-Chul
Author_Institution :
Korea Research Institute
Keywords :
Critical current; Surface morphology; Temperature dependence; Transistors; Yttrium barium copper oxide;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837176
