Title :
Radiation Hardening of FPGA-Based SoCs through Self-Reconfiguration and XTMR Techniques
Author :
Martin-Ortega, Alberto ; Alvarez, Maite ; Esteve, Sergio ; Rodriguez, Santiago ; Lopez-Buedo, Sergio
Author_Institution :
INTA - Inst. Nac. de Tec. Aeroespacial, Madrid
Abstract :
SRAM-based FPGAs are increasingly being used in space applications. However, there are still many concerns about the reliability of these devices in high-radiation environments, particularly due to the possibility of single-event upsets (SEUs) in the configuration memory. This paper presents an architecture for implementing radiation-hardened SoCs based on FPGAs. Previous works used triple module redundancy (TMR) techniques together with scrubbing mechanisms based on partial reconfiguration. However, these solutions required external configuration controllers that increased the system complexity and deviated the design from the SoC principles. The proposed architecture uses novel self- reconfiguration techniques in order to eliminate the need for external components, so that a full radiation-hardened SoC can be implemented in a single FPGA. Since self- reconfiguration allows for on-board remote hardware updates, reliability is tackled at two key levels: Radiation- hardened operation and hardware upgradeability to solve design errors.
Keywords :
SRAM chips; field programmable gate arrays; integrated circuit design; integrated circuit reliability; radiation hardening (electronics); reconfigurable architectures; redundancy; system-on-chip; FPGA-based SoC; SRAM-based FPGA; SoC principles; XTMR techniques; configuration memory; hardware upgradeability; high-radiation environments; on-board remote hardware updates; partial reconfiguration; radiation hardening; scrubbing mechanisms; self- reconfiguration techniques; self-reconfiguration; single-event upsets; system complexity; triple module redundancy techniques; Circuit testing; Field programmable gate arrays; Hardware; Performance evaluation; Radiation effects; Radiation hardening; Redundancy; Runtime; Single event transient; Single event upset;
Conference_Titel :
Programmable Logic, 2008 4th Southern Conference on
Conference_Location :
San Carlos de Bariloche
Print_ISBN :
978-1-4244-1992-0
DOI :
10.1109/SPL.2008.4547772