DocumentCode :
1921770
Title :
Fully automatic thin film permeameter
Author :
Yabukami, Shin ; Yamaguchi, M. ; Arai, K.I. ; Ando, H. ; Itagaki, A. ; Watanabe, M.
Author_Institution :
Tohoku Univ.
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837190
Filename :
837190
Link To Document :
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