DocumentCode :
1921795
Title :
Behavior Of Memory Elements In The Presence Of Power Supply Disturbances
Author :
Amer, Hassanein Hamed
fYear :
1996
fDate :
18-18 April 1996
Firstpage :
45
Lastpage :
51
Keywords :
Circuit faults; Circuit simulation; Clocks; Digital systems; Logic circuits; Microprocessors; Power supplies; Registers; SPICE; Single event upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Symposium, 1996. Reliability - Investing in the Future., IEEE 34th Annual Spring
Conference_Location :
Boxborough, MA, USA
Type :
conf
DOI :
10.1109/SRS.1996.618958
Filename :
618958
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1921795
