• DocumentCode
    1921953
  • Title

    Extraction Method for the Impact-Ionization Multiplication Factor in Silicon at Large Operating Temperatures

  • Author

    Gnani, E. ; Reggiani, S. ; Rudan, M. ; Baccarani, G.

  • Author_Institution
    ARCES-DEIS, University of Bologna, Italy
  • fYear
    2002
  • fDate
    24-26 September 2002
  • Firstpage
    227
  • Lastpage
    230
  • Keywords
    Discrete event simulation; Electric variables measurement; Electrons; Impact ionization; Numerical simulation; Predictive models; Semiconductor devices; Silicon; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194911
  • Filename
    1503841
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1921953