Title :
Nano Crystal Memory Devices Characterization Using the Charge Pumping Technique
Author :
Masson, P. ; Militaru, L. ; De Salvo, B. ; Ghibaudo, G. ; Celibert, V. ; Baron, T.
Author_Institution :
L2MP, UMR-CNRS 6137, Marseille, France, France
fDate :
24-26 September 2002
Keywords :
Charge pumps; Dielectric substrates; Electrons; Frequency; MISFETs; MOSFETs; Nanoscale devices; Nonvolatile memory; Silicon on insulator technology; Tunneling;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194913
