DocumentCode
1922015
Title
Coherent excitonic nonlinearity versus inhomogeneous broadening in single quantum wells
Author
Langbein, W. ; Borri, P. ; Hvam, J.M. ; Birkeda, D.
Author_Institution
Mikroelektronik Centret, Tech. Univ., Lyngby, Denmark
fYear
1998
fDate
8-8 May 1998
Firstpage
55
Lastpage
56
Abstract
Summary form only given.The coherent response of excitons in semiconductor nanostructures, as measured in four wave mixing (FWM) experiments, depends strongly on the inhomogeneous broadening of the exciton transition. We investigate GaAs-AlGaAs single quantum wells (SQW) of 4 nm to 25 nm well width. Two main mechanisms are found to be important. First, the excitation-induced dephasing FWM signal (EID), which leads to a strong dependence of the signal on the angle between the linear input polarizations. The presence of the EID in the mainly homogeneously broadened sample (25 nm) is shown by the beating between EID and two-photon coherence (TPC) at the exciton for negative delay and co-linear polarized excitation. It vanishes for cross-polarized excitation, thus excluding the importance of local-field effects.
Keywords
III-V semiconductors; aluminium compounds; excitons; gallium arsenide; light polarisation; multiwave mixing; semiconductor quantum wells; spectral line broadening; 25 nm; 4 nm; GaAs-AlGaAs; GaAs-AlGaAs single quantum wells; co-linear polarized excitation; coherent excitonic nonlinearity; cross-polarized excitation; excitation-induced dephasing; exciton transition; excitons; four wave mixing; homogeneously broadened sample; inhomogeneous broadening; linear input polarizations; local-field effects; negative delay; semiconductor nanostructures; single quantum wells; two-photon coherence; Delay effects; Excitons; Filling; Gallium arsenide; Gratings; Microscopy; Nanostructures; Polarization;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-541-2
Type
conf
DOI
10.1109/IQEC.1998.680119
Filename
680119
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