Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs

Author

Anghel, C. ; Hefyene, N. ; Ionescu, A. ; Frère, S.F. ; Gillon, R. ; Rhayem, J.

Author_Institution

EPFL, Lausanne, Switzerland

fYear

2002

fDate

24-26 September 2002

Firstpage

247

Lastpage

250

Keywords

MOSFETs; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

Print_ISBN

88-900847-8-2

Type

DOI

10.1109/ESSDERC.2002.194916

Filename

1503846

Link To Document