Title :
Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs
Author :
Anghel, C. ; Hefyene, N. ; Ionescu, A. ; Frère, S.F. ; Gillon, R. ; Rhayem, J.
Author_Institution :
EPFL, Lausanne, Switzerland
fDate :
24-26 September 2002
Keywords :
MOSFETs; Testing;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194916
