DocumentCode

1922040

Title

A study on practical nlts indicators for mdfe and m2dfe magnetic recording channels

Author

Ye, Weichun ; Bin Iiu ; Lee, Yuanxing

Author_Institution

Data Storage Institute

fYear

1999

fDate

18-21 May 1999

Keywords

Circuits; Degradation; Equalizers; Magnetic heads; Magnetic recording; Mass production; Memory; Nonlinear distortion; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International

Conference_Location

Kyongju, Korea

Print_ISBN

0-7803-5555-5

Type

conf

DOI

10.1109/INTMAG.1999.837200

Filename

837200