Title :
A study on practical nlts indicators for mdfe and m2dfe magnetic recording channels
Author :
Ye, Weichun ; Bin Iiu ; Lee, Yuanxing
Author_Institution :
Data Storage Institute
Keywords :
Circuits; Degradation; Equalizers; Magnetic heads; Magnetic recording; Mass production; Memory; Nonlinear distortion; Testing; Voltage;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837200
