DocumentCode :
1922626
Title :
Performance and Reliability of High Density Flash EEPROMs under CHISEL Programming Operation
Author :
Mahapatra, S. ; Shukuri, S. ; Bude, J.
Author_Institution :
EE Dept, IIT Bombay, India
fYear :
2002
fDate :
24-26 September 2002
Firstpage :
351
Lastpage :
354
Keywords :
Automatic testing; Channel hot electron injection; Character generation; Degradation; EPROM; Impact ionization; Integrated circuit reliability; Integrated circuit technology; Threshold voltage; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.194941
Filename :
1503871
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1922626
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