DocumentCode :
1922656
Title :
Monitoring Flash EEPROM Reliability by Equivalent Cell Analysis
Author :
Ielmini, Daniele ; Spinelli, Alessandro S. ; Lacaita, Andrea L. ; Gubello, Massimiliano ; Van Duuren, Michiel J.
Author_Institution :
DEI - Politecnico of Milano, Italy
fYear :
2002
fDate :
24-26 September 2002
Firstpage :
359
Lastpage :
362
Keywords :
Area measurement; Current measurement; Degradation; EPROM; Leakage current; Monitoring; Nonvolatile memory; Statistical distributions; Stress measurement; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.194943
Filename :
1503873
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1922656
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