Title :
Accurate Modeling of Quantum-Dot Based Multi Tunnel Junction Memory: Optimization and Process Dispersions Analyzes for DRAM Applications
Author :
Royer, Cyrille Le ; Carval, Gilles Le ; Fraboulet, David ; Sanquer, Marc
Author_Institution :
CEA-LETI, Grenoble, France
fDate :
24-26 September 2002
Keywords :
Character generation; Dispersion; Electrons; MOSFET circuits; Magnetic tunneling; Nonvolatile memory; Performance analysis; Quantum dots; Random access memory; Writing;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194953