Amorphization of bulk and thin film PLZT materials by 1.5 MeV krypton ion irradiation with in situ TEM observation

Transmission electron microscopy (TEM) samples prepared from both bulk and thin-film PLZT (lanthanum-modified lead zirconate titanate) materials have been irradiated with 1.5-MeV krypton ions at various temperatures. At room temperature, a PLZT 9/65/35 ceramic samples was found to be come completely amorphized after a dose of 2~×10¹⁴ ions/cm², much less than the critical amorphization dose for silicon. The sputter-deposited, fine-grained PLZT thin film took even a smaller dose to become amorphous. However, at 450°C, the upper temperature limit for the material to retain its desirable physical properties, the PLZT 9/65/35 was not amorphized even after a dose of 1.1×10¹⁵ ions/cm². PLZT is sensitive to ion-irradiation-induced amorphization because of its high nuclear stopping power and complex crystal structure