DocumentCode :
1922967
Title :
Gate Dielectrics for High Performance and Low Power CMOS SoC Applications
Author :
Cubaynes, F.N. ; Dachs, C.J.J. ; Detcheverry, C. ; Zegers, A. ; Venezia, V.C. ; Schmitz, J. ; Stolk, P.A. ; Jurczak, M. ; Henson, K. ; Degraeve, R. ; Rothschild, A. ; Conard, T. ; Petry, J. ; Da Rold, M. ; Schaekers, M. ; Badenes, G. ; Date, L. ; Pique, D
Author_Institution :
Philips Research, Leuven, Belgium
fYear :
2002
fDate :
24-26 September 2002
Firstpage :
427
Lastpage :
430
Keywords :
Annealing; Dielectrics; Furnaces; Implants; Oxidation; Plasma applications; Plasma devices; Plasma materials processing; Rapid thermal processing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.194959
Filename :
1503889
Link To Document :
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