• DocumentCode
    1923071
  • Title

    Modeling of a 1200 V 6 a SiC bipolar junction transistor

  • Author

    Yizhe Huang ; Shidong Cheng ; Weicheng Zhou ; Kuang Sheng

  • Author_Institution
    Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
  • fYear
    2013
  • fDate
    15-19 Sept. 2013
  • Firstpage
    934
  • Lastpage
    939
  • Abstract
    A SiC BJT model including quasi-saturation effects is proposed in this paper. The model limits the number of parameters required for the Gummel-Poon model and the model parameters have been extracted from experimental plots. The modeling results are then implemented in a circuit simulator such as Saber to build a SiC BJT model. Validity of the model is confirmed by comparing the model with experimental static and dynamic characteristics. The model is capable of accurately reproducing device dynamic switching behavior at various voltage levels and temperatures.
  • Keywords
    bipolar transistors; circuit simulation; semiconductor device models; silicon compounds; wide band gap semiconductors; Gummel-Poon model; Saber; SiC; SiC BJT model; SiC bipolar junction transistor model; circuit simulator; current 6 A; dynamic switching; quasisaturation effects; voltage 1200 V; Capacitance; Integrated circuit modeling; Junctions; Silicon carbide; Switches; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/ECCE.2013.6646803
  • Filename
    6646803