DocumentCode :
1923071
Title :
Modeling of a 1200 V 6 a SiC bipolar junction transistor
Author :
Yizhe Huang ; Shidong Cheng ; Weicheng Zhou ; Kuang Sheng
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
fYear :
2013
fDate :
15-19 Sept. 2013
Firstpage :
934
Lastpage :
939
Abstract :
A SiC BJT model including quasi-saturation effects is proposed in this paper. The model limits the number of parameters required for the Gummel-Poon model and the model parameters have been extracted from experimental plots. The modeling results are then implemented in a circuit simulator such as Saber to build a SiC BJT model. Validity of the model is confirmed by comparing the model with experimental static and dynamic characteristics. The model is capable of accurately reproducing device dynamic switching behavior at various voltage levels and temperatures.
Keywords :
bipolar transistors; circuit simulation; semiconductor device models; silicon compounds; wide band gap semiconductors; Gummel-Poon model; Saber; SiC; SiC BJT model; SiC bipolar junction transistor model; circuit simulator; current 6 A; dynamic switching; quasisaturation effects; voltage 1200 V; Capacitance; Integrated circuit modeling; Junctions; Silicon carbide; Switches; Temperature; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/ECCE.2013.6646803
Filename :
6646803
Link To Document :
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