• DocumentCode
    1923143
  • Title

    UIS-Failure of DMOS Power Transistors

  • Author

    Deckelmann, A. Icaza ; Wachutka, G. ; Hirler, F. ; Krumrey, J.

  • Author_Institution
    Institute for Physics of Electrotechnology, Munich, Germany
  • fYear
    2002
  • fDate
    24-26 September 2002
  • Firstpage
    459
  • Lastpage
    462
  • Keywords
    Charge carrier density; Current distribution; Electrons; Failure analysis; Numerical analysis; Power transistors; Proximity effect; Semiconductor optical amplifiers; Temperature distribution; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194967
  • Filename
    1503897
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1923143