DocumentCode :
1923248
Title :
Electrical Characterisation of Silicon-Rich-Oxide Based Memory Cells Using Pulsed Current-Voltage Techniques
Author :
Rosmeulen, M. ; Sleeckx, E. ; De Meyer, K.
Author_Institution :
KU Leuven, Belgium and IMEC, Leuven, Belgium
fYear :
2002
fDate :
24-26 September 2002
Firstpage :
471
Lastpage :
474
Keywords :
Capacitance-voltage characteristics; Channel bank filters; Crystallization; Dielectrics; Electrodes; Fluid flow; Nonvolatile memory; Silicon; Space vector pulse width modulation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.194970
Filename :
1503900
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1923248
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