Title :
Reliability and Retention Study of Nanocrystal Cell Array
Author :
Gerardi, C. ; Ammendola, G. ; Melanotte, M. ; Lombardo, S. ; Crupi, I.
Author_Institution :
STMicroelectronics, Catania, Italy
fDate :
24-26 September 2002
Keywords :
CMOS technology; Dielectrics; Electrons; Nanocrystals; Physics; Research and development; Robustness; Silicon compounds; Threshold voltage; Tunneling;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194971
