Title :
Intermodulation distortion simulation using physical GaAs FET model
Author :
Contrata, W. ; Ando, Y. ; Hori, Y. ; Kuzuhara, M.
Author_Institution :
Corp. Syst. Devices & Fundamental Res., NEC Corp., Shiga, Japan
Abstract :
Intermodulation distortion is simulated using a physical GaAs FET model for the first time, to our knowledge. A GaAs FET power amplifier, including input and output circuits, is examined. For the FET, a fully 2-dimensional Monte Carlo simulator is used. The simulated P/sub IN/-P/sub OUT/ performance is in fair agreement with measured data. Gain and phase compression (AM-PM) characteristics are simulated, and correlated to features in the RF I-V characteristics. Finally, third order intermodulation distortion is estimated from the AM-PM characteristics and compared to measurement, with qualitative agreement. This technique advances the art of computer aided design of nonlinear devices because it allows the prediction of distortion characteristics before undertaking an expensive and time-consuming device fabrication.
Keywords :
III-V semiconductors; Monte Carlo methods; circuit simulation; gallium arsenide; intermodulation distortion; microwave field effect transistors; microwave power amplifiers; semiconductor device models; 2D Monte Carlo simulator; AM-PM characteristics; GaAs; GaAs FET power amplifier; IMD simulation; RF I-V characteristics; gain characteristics; intermodulation distortion simulation; nonlinear devices; phase compression characteristics; physical GaAs FET model; third order IMD estimation; third order intermodulation distortion; Art; Circuit simulation; Computational modeling; Distortion measurement; FETs; Gallium arsenide; Intermodulation distortion; Monte Carlo methods; Power amplifiers; Radio frequency;
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-6538-0
DOI :
10.1109/MWSYM.2001.967017