Title :
Photorefractive image amplification at extremely low light levels
Author :
Gilbreath, G.C. ; Clement, A.E. ; Reintjes, J. ; McKnight, R., Jr.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fDate :
30 Aug-2 Sep 1992
Abstract :
The authors report measurements of image amplification at extremely low light levels in BaTiO3 using photorefractive two-wave mixing. Image amplification for signal levels as low as 20 pW with a Fresnel number of 382 was observed. Comparisons of Fourier and direct imaging show that amplification of the Fourier transform of the image provides improved image quality and field-of-view at the lowest light levels. Fourier imaging inherently filters out noise generated from scatterers; consequently, minimum detectable signal levels can be lower. Image structure is viably recovered with far smaller illuminated volumes using Fourier imaging; hence, crystals with smaller apertures may be used. Finally, Fourier imaging is readily implementable and does not require complex optical interferometers or mechanical methods, which reduce signal power as well as noise
Keywords :
Fourier transform optics; barium compounds; multiwave mixing; optical images; photorefractive effect; photorefractive materials; 20 pW; BaTiO3; Fourier imaging; Fourier transform; Fresnel number; direct imaging; image amplification; image quality; low light levels; mechanical methods; optical interferometers; photorefractive two-wave mixing; signal-to-noise ratio; Fourier transforms; Image quality; Noise generators; Noise level; Optical filters; Optical imaging; Optical noise; Optical scattering; Photorefractive effect; Signal generators;
Conference_Titel :
Applications of Ferroelectrics, 1992. ISAF '92., Proceedings of the Eighth IEEE International Symposium on
Conference_Location :
Greenville, SC
Print_ISBN :
0-7803-0465-9
DOI :
10.1109/ISAF.1992.300744