DocumentCode :
1923859
Title :
Integration of Porous Silicon Interference Filters in Si-Photodiodes
Author :
Kruiger, M. ; Berger, M.G. ; Marso, M. ; Thönissen, M. ; Hilbrich, S. ; Theib, W. ; Loo, R. ; Eickhoff, Th. ; Reetz, W. ; Grosse, P. ; Luth, H.
Author_Institution :
Forschungszentrum J?lich GmbH, D-52425 J?lich, Germany
fYear :
1996
fDate :
9-11 Sept. 1996
Firstpage :
891
Lastpage :
894
Abstract :
A novel type of color-sensitive Si-photodiodes is presented Color-sensitivity is achieved by using porous silicon (PS) interference filters which were integrated in the p+-type part of conventional Si pn-junctions. These interference filters consist of PS layers with alternating high and low porosity, corresponding to low and high refractive inde-xes, respectively. Such structures can be fabricated very cheap and fast by varying the anodization current density during the anodic etching of the PS. In this way, we were able to realize Bragg-reflectors and Fabry-Perot filters whose transmission characteristics caused a strong modification of the photodiodes´ spectral response.
Keywords :
Current density; Etching; Interference; Optical filters; Optical refraction; Optical variables control; Optical waveguides; Photodiodes; Refractive index; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy
Print_ISBN :
286332196X
Type :
conf
Filename :
5435938
Link To Document :
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