DocumentCode :
1924295
Title :
Thermal stability and reliability of spin-valve films with synthetic antiferromagnet exchange-biased by IrMn
Author :
Fuke, H.N. ; Saito, K. ; Yoshikawa, M. ; Koui, K. ; Iwasaki, H. ; Sahashi, M.
Author_Institution :
Toshiba Corporation
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Annealing; Antiferromagnetic materials; Grain size; Magnetic fields; Magnetic films; Magnetic heads; Magnetic materials; Magnetic recording; Temperature; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837317
Filename :
837317
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1924295
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