DocumentCode
1924418
Title
Effect of the underlayer on the exchange bias in Fe/sub 50/Mn/sub 50//Ni/sub 80/Fe/sub 20/ this films
Author
Pollard, R.J. ; Henderson, K. ; Dodd, P.M. ; Atkinson, R.
Author_Institution
The Queen´´s University of Belfast
fYear
1999
fDate
18-21 May 1999
Keywords
Atomic force microscopy; Atomic layer deposition; FCC; Iron; Physics; Rough surfaces; Silicon; Surface morphology; Surface roughness; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837324
Filename
837324
Link To Document