DocumentCode :
1924418
Title :
Effect of the underlayer on the exchange bias in Fe/sub 50/Mn/sub 50//Ni/sub 80/Fe/sub 20/ this films
Author :
Pollard, R.J. ; Henderson, K. ; Dodd, P.M. ; Atkinson, R.
Author_Institution :
The Queen´´s University of Belfast
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Atomic force microscopy; Atomic layer deposition; FCC; Iron; Physics; Rough surfaces; Silicon; Surface morphology; Surface roughness; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837324
Filename :
837324
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1924418
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