DocumentCode
1924457
Title
Network vulnerability to single, multiple, and probabilistic physical attacks
Author
Agarwal, Pankaj K. ; Efrat, A. ; Ganjugunte, Shashidhara K. ; Hay, David ; Sankararaman, Swaminathan ; Zussman, Gil
fYear
2010
fDate
Oct. 31 2010-Nov. 3 2010
Firstpage
1824
Lastpage
1829
Abstract
Telecommunications networks heavily rely on the physical infrastructure and, are therefore, vulnerable to natural disasters, such as earthquakes or floods, as well as to physical attacks, such as an Electromagnetic Pulse (EMP) attack. Large-scale disasters are likely to destroy network equipment and to severely affect interdependent systems such as the power-grid. In turn, long-term outage of the power-grid might cause additional failures to the telecommunication network. In this paper, we model an attack as a disk around its epicenter, and provide efficient algorithms to find vulnerable points within the network, under various metrics. In addition, we consider the case in which multiple disasters happen simultaneously and provide an approximation algorithm to find the points which cause the most significant destruction. Finally, since a network element does not always fail, even when it is close to the attack´s epicenter, we consider a simple probabilistic model in which the probability of a network element failure is given. Under this model, we tackle the cases of single and multiple attacks and develop algorithms that identify potential points where an attack is likely to cause a significant damage.
Keywords
electromagnetic pulse; power grids; telecommunication networks; telecommunication security; approximation algorithm; electromagnetic pulse attack; large-scale disasters; long term outage; multiple physical attacks; network element failure; network vulnerability; physical infrastructure; power grid; probabilistic physical attacks; simple probabilistic model; single physical attacks; telecommunications networks; Approximation algorithms; Approximation methods; EMP radiation effects; Face; Network topology; Probabilistic logic; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
MILITARY COMMUNICATIONS CONFERENCE, 2010 - MILCOM 2010
Conference_Location
San Jose, CA
ISSN
2155-7578
Print_ISBN
978-1-4244-8178-1
Type
conf
DOI
10.1109/MILCOM.2010.5679556
Filename
5679556
Link To Document