Analysis of large finite frequency selective surfaces embedded in dielectric layers

This paper presents an efficient approach for the analysis of large finite multiple frequency selective surfaces (FSSs) embedded in dielectric layers. Numerical results are presented for two typical test cases and are validated by using an element-by-element MoM approach. The proposed approach can handle arbitrarily large arrays, and offers significant savings in computational time without compromising accuracy. For practical radomes comprising thousands of elements, the use of the direct MoM technique would be totally impractical, owing to an enormous burden imposed on computational time and memory. However, the proposed approach does not suffer from this limitation, since the computational time required by this method is virtually independent of the number of elements in the finite structure.