Title :
Test Data Compression by Spilt-VIHC (SVIHC)
Author :
Giri, Chandan ; Rao, B Mallikarjuna ; Chattopadhyay, Santanu
Author_Institution :
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur
Abstract :
This paper suggests a new test data compression scheme that performs Huffman coding on different sections of test data file separately. It improves upon the single Huffman tree based approach by up to 6% in compression ratio, 29% in test application time, sacrificing only 6.1% in the decoder area. The scheme compares favourably with other works reported in the literature. While for most of the cases, it produces better compression ratios, the area requirements are much lesser than other contemporary works
Keywords :
Huffman codes; binary codes; data compression; Huffman coding; binary codes; compression ratio; split-VIHC; test data compression; Channel capacity; Costs; Decoding; Dictionaries; Frequency; Heuristic algorithms; Huffman coding; Performance evaluation; System testing; Test data compression;
Conference_Titel :
Computing: Theory and Applications, 2007. ICCTA '07. International Conference on
Conference_Location :
Kolkata
Print_ISBN :
0-7695-2770-1
DOI :
10.1109/ICCTA.2007.123