DocumentCode :
1924707
Title :
Test Data Compression by Spilt-VIHC (SVIHC)
Author :
Giri, Chandan ; Rao, B Mallikarjuna ; Chattopadhyay, Santanu
Author_Institution :
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur
fYear :
2007
fDate :
5-7 March 2007
Firstpage :
146
Lastpage :
150
Abstract :
This paper suggests a new test data compression scheme that performs Huffman coding on different sections of test data file separately. It improves upon the single Huffman tree based approach by up to 6% in compression ratio, 29% in test application time, sacrificing only 6.1% in the decoder area. The scheme compares favourably with other works reported in the literature. While for most of the cases, it produces better compression ratios, the area requirements are much lesser than other contemporary works
Keywords :
Huffman codes; binary codes; data compression; Huffman coding; binary codes; compression ratio; split-VIHC; test data compression; Channel capacity; Costs; Decoding; Dictionaries; Frequency; Heuristic algorithms; Huffman coding; Performance evaluation; System testing; Test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computing: Theory and Applications, 2007. ICCTA '07. International Conference on
Conference_Location :
Kolkata
Print_ISBN :
0-7695-2770-1
Type :
conf
DOI :
10.1109/ICCTA.2007.123
Filename :
4127358
Link To Document :
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