DocumentCode
1925109
Title
Effects of E×B velocity shear on high and low frequency fluctuations excited by electron temperature gradient
Author
Kaneko, Toshiro ; Moon, Chanho ; Hatakeyama, Rikizo
Author_Institution
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
fYear
2011
fDate
13-20 Aug. 2011
Firstpage
1
Lastpage
4
Abstract
Electron temperature gradient (ETG) perpendicular to magnetic field lines is formed by superimposing high-temperature electrons of an electron cyclotron resonance (ECR) plasma upon low-temperature thermionic electrons emitted from a tungsten hot plate. The formed ETG is found to excite a high-frequency fluctuation, i.e., ETG mode, and also, to enhance a low-frequency fluctuation originally caused by an E×B velocity shear. Furthermore, the strong E×B velocity shear is demonstrated to suppress the ETG mode experimentally.
Keywords
cyclotron resonance; plasma fluctuations; plasma transport processes; thermionic electron emission; ETG mode; electron cyclotron resonance plasma; electron temperature gradient; high-frequency fluctuation; high-temperature electrons; low frequency fluctuation; low-frequency fluctuation; low-temperature thermionic electrons; magnetic field lines; strong ExB velocity shear; tungsten hot plate; Cyclotrons; Electric potential; Fluctuations; Heating; Plasma temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
General Assembly and Scientific Symposium, 2011 XXXth URSI
Conference_Location
Istanbul
Print_ISBN
978-1-4244-5117-3
Type
conf
DOI
10.1109/URSIGASS.2011.6051088
Filename
6051088
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