DocumentCode
1925139
Title
Keynote: Endurance Barriers and Solutions for Flash Memory
Author
Tei-Wei Kuo
Author_Institution
Nat. Taiwan Univ., Taipei
fYear
2009
fDate
25-27 May 2009
Abstract
Flash memory has penetrated many facets of consumer technology in recent years. Within one decade after its invention, we had witnessed the tremendous growth of the flash market. As flash memory gains its momentum, new challenges also emerge. In this talk, we will address endurance issues in the designs of flash-memory storage/file systems. Challenges on the design methodologies will also be presented. In particular, we will present solutions in wear leveling. Related issues in performance enhancement and disturbing problems will be addressed. Multi-stage programming is a paradigm for writing generic programs that do not pay a runtime overhead. The key underlying technology is program generation.
Keywords
flash memories; endurance barriers; file systems; flash-memory storage systems; multi-stage programming; performance enhancement; program generation; wear leveling; Computer science; Design methodology; Educational institutions; File systems; Flash memory; Graduate/Undergraduate Teaching Awards Committee; Informatics; Real time systems; Runtime; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Embedded Software and Systems, 2009. ICESS '09. International Conference on
Conference_Location
Zhejiang
Print_ISBN
978-1-4244-4359-8
Type
conf
DOI
10.1109/ICESS.2009.59
Filename
5066620
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