• DocumentCode
    1925585
  • Title

    Polygonizing skeletal sheets of CT-scanned objects by partitioin of unity approximations

  • Author

    Nagai, Yukie ; Ohtake, Yutaka ; Kase, Kiwamu ; Suzuki, Hiromasa

  • Author_Institution
    Univ. of Tokyo, Tokyo
  • fYear
    2008
  • fDate
    4-6 June 2008
  • Firstpage
    265
  • Lastpage
    266
  • Abstract
    The skeletal structures of solid objects play an important role in medical and industrial applications. Given a volumetrically sampled solid object, our method extracts a nice-looking skeletal structure represented as a polygon mesh. The purpose is to achieve a noise-robust extraction of the skeletal mesh from a real-world object obtained using a scanning technology such as the CT scan method. We first approximate the input through a set of spherically supported polynomials that provide an adaptively smoothed intensity field, and then perform a polygonization process to find the extremal sheet of the field, which is regarded as a skeletal sheet in this research. In our polygonization, a subset of the weighted Delaunay tetrahedrization defined by a set of spherical supports is used as an adaptively sampled grid. The derivatives for detecting extremality are analytically evaluated at the tetrahedron vertices. We also demonstrate the effectiveness of our method by extracting skeletal meshes from noisy CT images.
  • Keywords
    computerised tomography; feature extraction; medical image processing; CT-scanned objects; industrial applications; medical applications; polygon mesh; polygonization process; robust extraction; scanning technology; skeletal sheets; skeletal structures; unity approximations; volumetrically sampled solid object; weighted Delaunay tetrahedrization; Biomedical imaging; Computed tomography; Mechanical variables measurement; Noise figure; Noise robustness; Polynomials; Reverse engineering; Skeleton; Solids; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Shape Modeling and Applications, 2008. SMI 2008. IEEE International Conference on
  • Conference_Location
    Stony Brook, NY
  • Print_ISBN
    978-1-4244-2260-9
  • Electronic_ISBN
    978-1-4244-2261-6
  • Type

    conf

  • DOI
    10.1109/SMI.2008.4547999
  • Filename
    4547999