• DocumentCode
    1925606
  • Title

    Power loss and thermal characterization of IGBT modules in the Alternate Arm converter

  • Author

    Judge, P.D. ; Merlin, Michael M. C. ; Mitcheson, Paul D. ; Green, T.C.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
  • fYear
    2013
  • fDate
    15-19 Sept. 2013
  • Firstpage
    1725
  • Lastpage
    1731
  • Abstract
    Power losses in high power HVDC converters are dominated by those that occur within the power electronic devices. This power loss is dissipated as heat at the junction of semiconductor devices. The cooling system ensures that the generated heat is evacuated outside the converter station but temperature management remains critical for the lifetime of the semiconductor devices. This paper presents the results of a study on the temperature profile of the different switches inside a multilevel converter. The steady state junction temperatures are observed through the simulation of a 20 MW Alternate Arm Converter using 1.2kA 3.3 kV IGBT modules. A comparison of the Alternate Arm Converter is made against the case of both the half-bridge and full-bridge Modular Multilevel Converter topologies. Furthermore, the concept of varying the duty-cycle of the two alternative zero-voltage states of the H-bridge modules is introduced. Simulation results demonstrate that it can change the balance of electrical and thermal stress between the two top switches and the two bottom switches of a full-bridge cell.
  • Keywords
    HVDC power convertors; bridge circuits; cooling; power semiconductor switches; H-bridge modules; IGBT modules; alternate arm converter; converter station; cooling system; current 1.2 kA; duty-cycle variation; electrical stress; full-bridge modular multilevel converter topologies; half-bridge modular multilevel converter topologies; high power HVDC converters; power electronic devices; power loss dissipation; semiconductor device junction; temperature management; temperature profile; thermal characterization; thermal stress; voltage 3.3 kV; zero-voltage states; Finite element analysis; Heating; Insulated gate bipolar transistors; Junctions; Mathematical model; Semiconductor diodes; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/ECCE.2013.6646915
  • Filename
    6646915