DocumentCode :
1925606
Title :
Power loss and thermal characterization of IGBT modules in the Alternate Arm converter
Author :
Judge, P.D. ; Merlin, Michael M. C. ; Mitcheson, Paul D. ; Green, T.C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
fYear :
2013
fDate :
15-19 Sept. 2013
Firstpage :
1725
Lastpage :
1731
Abstract :
Power losses in high power HVDC converters are dominated by those that occur within the power electronic devices. This power loss is dissipated as heat at the junction of semiconductor devices. The cooling system ensures that the generated heat is evacuated outside the converter station but temperature management remains critical for the lifetime of the semiconductor devices. This paper presents the results of a study on the temperature profile of the different switches inside a multilevel converter. The steady state junction temperatures are observed through the simulation of a 20 MW Alternate Arm Converter using 1.2kA 3.3 kV IGBT modules. A comparison of the Alternate Arm Converter is made against the case of both the half-bridge and full-bridge Modular Multilevel Converter topologies. Furthermore, the concept of varying the duty-cycle of the two alternative zero-voltage states of the H-bridge modules is introduced. Simulation results demonstrate that it can change the balance of electrical and thermal stress between the two top switches and the two bottom switches of a full-bridge cell.
Keywords :
HVDC power convertors; bridge circuits; cooling; power semiconductor switches; H-bridge modules; IGBT modules; alternate arm converter; converter station; cooling system; current 1.2 kA; duty-cycle variation; electrical stress; full-bridge modular multilevel converter topologies; half-bridge modular multilevel converter topologies; high power HVDC converters; power electronic devices; power loss dissipation; semiconductor device junction; temperature management; temperature profile; thermal characterization; thermal stress; voltage 3.3 kV; zero-voltage states; Finite element analysis; Heating; Insulated gate bipolar transistors; Junctions; Mathematical model; Semiconductor diodes; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/ECCE.2013.6646915
Filename :
6646915
Link To Document :
بازگشت