• DocumentCode
    1925813
  • Title

    On-wafer production monitoring of GMR spin valve pinned layer and free layer properties

  • Author

    Gans, Ronald R. ; Blank, Hans-Richard ; Bornfreund, R. ; van der Heijden, P.

  • Author_Institution
    Applied Magnetics Corporation
  • fYear
    1999
  • fDate
    18-21 May 1999
  • Keywords
    Demagnetization; Electric variables measurement; Electrical resistance measurement; Magnetic field measurement; Magnetic properties; Magnetic switching; Monitoring; Production; Spin valves; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
  • Conference_Location
    Kyongju, Korea
  • Print_ISBN
    0-7803-5555-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1999.837393
  • Filename
    837393
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1925813