Title :
Micro-track profile of ESD damaged AMR and GMR heads
Author :
Jang, E.K. ; Kim, W.W. ; Kao, A.S. ; Lee, H.J.
Author_Institution :
Samsung Information System America
Keywords :
Electrostatic discharge; Magnetic heads; Permanent magnets;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837400
