Title :
Rad-tolerant flight VLSI from commercial foundries
Author :
Gambes, J.W. ; Maki, Gary K.
Author_Institution :
Microelectron. Res. Center, New Mexico Univ., Albuquerque, NM, USA
Abstract :
This paper reviews techniques which have been used to protect CMOS circuits from the deleterious effects of the natural space radiation environment. Three custom flight VLSI processors have been designed and fabricated at commercial foundries. A program has been initiated to provide this radiation-tolerant VLSI technology to designers of Application Specific Integrated Circuits
Keywords :
CMOS digital integrated circuits; VLSI; application specific integrated circuits; integrated circuit design; integrated circuit reliability; leakage currents; protection; radiation effects; radiation hardening (electronics); space vehicle electronics; ASIC; CMOS circuit protection; commercial foundries; custom flight VLSI processors; natural space radiation environment; rad-tolerant flight VLSI; radiation-tolerant VLSI technology; Circuits; Electron traps; Foundries; Interface states; Ionizing radiation; Microelectronics; Radiation hardening; Satellites; Space technology; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1996., IEEE 39th Midwest symposium on
Conference_Location :
Ames, IA
Print_ISBN :
0-7803-3636-4
DOI :
10.1109/MWSCAS.1996.593127
