DocumentCode :
1925995
Title :
MR sensor oxidation mechanism at high temperature
Author :
Xie, Chang ; Davis, Marshall ; Schultz, Allan
Author_Institution :
Seagate Recording Heads
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Degradation; Failure analysis; Magnetic heads; Oxidation; Stress measurement; Temperature sensors; Testing; Thermal sensors; Thermal stresses; Thermodynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837401
Filename :
837401
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1925995
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