Title :
MeV gamma ray detection algorithms for stacked silicon detectors
Author :
McMurray, Robert E., Jr. ; Hubbard, G. Scott ; Wercinski, Paul F. ; Keller, Robert G.
Author_Institution :
NASA Ames Res. Center, Moffett Field, CA, USA
Abstract :
By making use of the signature of a gamma ray event as it appears in a stack of N=5 to 20 lithium-drifted silicon detectors and applying smart selection algorithms, gamma rays in the energy range of 1 to 8 MeV can be detected with good efficiency and selectivity. Examples of the types of algorithms used for different energy regions include the simple sum mode, the sum-coincidence mode used in segmented detectors, unique variations of sum-coincidence for an N-dimensional vector event, and a new and extremely useful mode for double escape peak spectroscopy at pair-production energies. The latter algorithm yields a spectrum similar to that of the pair spectrometer, but without the need for the dual external segments for double escape coincidence, and without the large loss in efficiency of double escape events. Background events due to Compton scattering are largely suppressed. Monte Carlo calculations were used to model the gamma ray interactions in the silicon in order to enable testing of a wide array of different algorithms on the event N-vectors for a large-N stack
Keywords :
coincidence techniques; gamma-ray detection and measurement; semiconductor counters; 1 to 8 MeV; Compton scattering; Monte Carlo; Si:Li; double escape peak spectroscopy; gamma ray detection algorithms; simple sum mode; stacked Si detectors; sum-coincidence mode; Event detection; Extraterrestrial measurements; Gamma ray detection; Gamma ray detectors; Gamma rays; Monte Carlo methods; Silicon; Spectroscopy; Temperature; Testing;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
DOI :
10.1109/NSSMIC.1992.301144