DocumentCode
1926456
Title
A method for identifying robust dependent and functionally unsensitizable paths
Author
Kajihara, Seiji ; Kinoshita, Kozo ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Japan
fYear
1997
fDate
4-7 Jan 1997
Firstpage
82
Lastpage
87
Abstract
It has been shown previously that a logic circuit often contains a large number of logical paths that need not be tested to verify the timing behavior of the circuit, if the other paths are robustly tested. These paths are called robust dependent. A subset of the robust dependent paths are the functionally unsensitizable paths. This paper proposes a method for efficiently identifying both types of paths. The proposed procedure uses local circuit analysis to keep the run time relatively low, and relatively independent of the number of paths in the circuit. The method may not identify all the paths that are robust dependent or functionally unsensitizable, however, experimental results show that the numbers it finds are comparable, and sometimes even higher than those found by other methods. The procedure can be applied to circuits that cannot be handled by other methods
Keywords
logic circuits; logic testing; functionally unsensitizable path; local circuit analysis; logic circuit testing; robust dependent path; timing; Circuit analysis; Circuit faults; Circuit testing; Delay effects; Digital systems; Logic circuits; Logic testing; Physics computing; Robustness; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1997. Proceedings., Tenth International Conference on
Conference_Location
Hyderabad
ISSN
1063-9667
Print_ISBN
0-8186-7755-4
Type
conf
DOI
10.1109/ICVD.1997.567965
Filename
567965
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