DocumentCode :
1926506
Title :
Segmentation and location of abnormality in brain MR images using distributed estimation
Author :
Vithyavallipriya, A. ; Sankaragomathi, B. ; Ramakrishnan, T.
Author_Institution :
Dept. of Electron. & Instrum. Eng., Nat. Eng. Coll., Kovilpatti, India
fYear :
2013
fDate :
7-9 Jan. 2013
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a modern semi supervised scheme for the detection and segmentation of abnormalities present in the brain MR images. The high degree of automation can be attained by using semi supervised learning, because it does not require any pathology modeling. If the dimensionality of the data is large then the estimation of the probability density function is not possible. To overcome this every image is handled as a network of locally coherent image partitions. Median filter is used for preserving edges while removing noise. Contrast enhancement automatically adjusts the intensity values of the image to achieve a better quality. The block wise separation is carried out by calculating the parameter like principal component analysis (PCA), Eigen value, Eigen vector, maximum likelihood function. The maximum likelihood function which estimating the abnormality for each partition is formulated. The likelihood function consists of a model and a data term and is formulated as a quadratic programming problem.
Keywords :
biomedical MRI; brain; eigenvalues and eigenfunctions; image denoising; image enhancement; image segmentation; learning (artificial intelligence); maximum likelihood estimation; median filters; principal component analysis; quadratic programming; abnormality location; brain MR images; eigen value; eigen vector; image segmentation; locally coherent image partitions; maximum likelihood function; median filter; principal component analysis; quadratic programming; semisupervised learning; Entropy; Image segmentation; Information filters; Instruments; Pathology; Principal component analysis; distributed estimation; maximum likelihood function; semi supervised learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT), 2013 International Conference on
Conference_Location :
Tiruvannamalai
Print_ISBN :
978-1-4673-5300-7
Type :
conf
DOI :
10.1109/ICEVENT.2013.6496568
Filename :
6496568
Link To Document :
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