• DocumentCode
    1926581
  • Title

    A method to increase scintillation lifetime measurement rates using a multi-hit TDC

  • Author

    Moses, W.W.

  • Author_Institution
    Lawrence Berkeley Lab., California Univ., Berkeley, CA, USA
  • fYear
    1992
  • fDate
    25-31 Oct 1992
  • Abstract
    Summary form only. A method for using a modern TDC (time-to-digital converter) to increase the scintillation lifetime measurement rate by a factor of over 300 is discussed. It uses the delayed coincidence method, where a start photomultiplier tube (PMT) provides a signal synchronized to the excitation of the specimen and a stop PMT samples the resulting fluorescent lifetime spectrum. Typical data acquisition rates are low because the light collection efficiency of the stop PMT is artificially limited to ∈≈0.001 fluorescent photons per start signal to reduce the probability of detecting >1 photon per excitation. Some modern TDCs can detect whether additional stop signals occur during the sampling period and thus reject events in which >1 stop photons are present. This allows ∈ to be increased to 1, which maximizes the data acquisition rate at a value over 300 times higher. Multi-hit TDCs can digitize the arrival times of n stop signals per start signal, which allows ∈ to be increased to ≈n. Since multiple photon events, which usually bias the data, are eliminated or measured, this method also improves the measurement accuracy
  • Keywords
    coincidence techniques; photomultipliers; scintillation counters; arrival times; delayed coincidence method; fluorescent lifetime spectrum; light collection efficiency; multi-hit TDC; multiple photon events; photomultiplier; scintillation lifetime measurement; Data acquisition; Delay; Event detection; Fluorescence; Laboratories; Lifetime estimation; Modems; Sampling methods; Solid scintillation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0884-0
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1992.301173
  • Filename
    301173