• DocumentCode
    1926904
  • Title

    Fast power integrity estimation method by use of LSI power-pin model

  • Author

    Harada, Takashi ; Ogawa, Masashi ; Kusumoto, Manabu

  • Author_Institution
    NEC Corp., Sagamihara, Japan
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Fast power integrity analysis system to realize the chip-package-board co-design is described. As high-speed signal processing of semiconductor chips and high-density packaging technologies are progressed, circuit margins are reduced and the packaging design becomes difficult more and more. These difficulties often bring re-designs of board and package layouts. Short turn-around-time estimation techniques for analyzing the electrical performance integrating chip-package-board characteristics have been required for reducing the time loss by the rework and increase design efficiency,. This system contributes to the increase of design efficiency in the early product development stage followed by reducing the time loss due to the rework in the development process.
  • Keywords
    chip-on-board packaging; integrated circuit modelling; large scale integration; LSI power-pin model; chip-package-board codesign; circuit margins; fast power integrity analysis system; fast power integrity estimation method; high-density packaging technology; high-speed signal processing; package layouts; semiconductor chips; short turn-around-time estimation techniques; Analytical models; Equivalent circuits; Fluctuations; Integrated circuit modeling; Large scale integration; Layout; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan, 2010 IEEE
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-7593-3
  • Type

    conf

  • DOI
    10.1109/CPMTSYMPJ.2010.5679672
  • Filename
    5679672