Title :
Microwave on-wafer characterization of three-port devices using shield-based test-fixtures
Author :
Kulding, T.E. ; Jenner, M.B. ; Laursen, S.
Author_Institution :
RISC, Aalborg Univ., Denmark
Abstract :
The capability of shield-based test-fixture design used in conjunction with three-port device measurements is demonstrated. The reduction of forward coupling and common-ground parasitics facilitates simple de-embedding that can easily be applied to multi-port measurements. The procedure is detailed and the capability of the method is demonstrated with gigahertz device measurements.
Keywords :
electromagnetic shielding; microwave measurement; multiport networks; common-ground parasitics; de-embedding; forward coupling; gigahertz device; microwave on-wafer measurement; shield-based test fixture; three-port device; Circuit testing; Coupling circuits; Impedance measurement; Integrated circuit measurements; Integrated circuit modeling; Measurement standards; Microwave devices; Radio frequency; Radiofrequency integrated circuits; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-6538-0
DOI :
10.1109/MWSYM.2001.967195
